using at-speed testing with occ on-chip clock cont 相關文章
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View Lab - 294647845-DFT-with-OCC-on-SoC from ELECTRONICS 1 at Amrita Vishwa Vidyapeetham. Using at-speed testing with O...
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2017年6月26日 — A method to debug missed at-speed capture clock pulse of “On chip Clock Controller” (OCC) in ATPG mode .....
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由 W Lin 著作 · 2013 · 被引用 9 次 — Abstract—In this paper, an on-chip clock (OCC) controller with bypass function based...
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Using at-speed testing with OCC (On Chip Clock Control). on a complex SoC, a ... Scan at-speed OCC mode selection is gen...
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On-Chip Clock Controller. OCC -Overview On-Chip Clock Control (OCC) At-speed scan testing, or scan testing at the actual...
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由 EM Ooi 著作 · 2013 · 被引用 2 次 — This paper proposes a test strategy for improving SoC ATPG testing. On-chip clock c...
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2018年11月20日 — 1.2 何为全速测试(at speed test):. 在工艺节点在130nm以下的时候,很多 ... Count Testde scan test。 继续访问. DFT测试-OCC电路介绍. DFT测试-O...
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OCC is the logic inserted on the SOC for controlling clocks during silicon testing on ATE (Automatic test Equipment). Si...
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All test clocks in scan friendly design is routed through an OCC, which controls clock operation in scan mode(both in st...
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Experimental results demonstrate that the proposed clock-chain based test clock control scheme using an internal phase-l...
using at-speed testing with occ on-chip clock cont 參考影音
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